C. Kopf et al., PHYSICAL MODELS FOR STRAINED AND RELAXED GAINAS ALLOYS - BAND-STRUCTURE AND LOW-FIELD TRANSPORT, Solid-state electronics, 41(8), 1997, pp. 1139-1152
We describe models for physical properties of the technologically sign
ificant GaInAs material system with respect to its composition and str
ain conditions introduced by strained-layer heteroepitaxy. We give an
empirical relation for the critical thickness which takes growth condi
tions into account and allows the residual strain for layer thicknesse
s exceeding the critical one to be estimated. Easy to use models for t
he band edge energy and effective mass are presented, which are based
on deformation potential and k.p theory. Monte Carlo calculations were
employed to obtain a model for the anisotropic electron mobility. All
models are given as functions of the independent parameters compositi
on and strain which are no longer strictly coupled in the relaxed case
.