PHYSICAL MODELS FOR STRAINED AND RELAXED GAINAS ALLOYS - BAND-STRUCTURE AND LOW-FIELD TRANSPORT

Citation
C. Kopf et al., PHYSICAL MODELS FOR STRAINED AND RELAXED GAINAS ALLOYS - BAND-STRUCTURE AND LOW-FIELD TRANSPORT, Solid-state electronics, 41(8), 1997, pp. 1139-1152
Citations number
67
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
41
Issue
8
Year of publication
1997
Pages
1139 - 1152
Database
ISI
SICI code
0038-1101(1997)41:8<1139:PMFSAR>2.0.ZU;2-T
Abstract
We describe models for physical properties of the technologically sign ificant GaInAs material system with respect to its composition and str ain conditions introduced by strained-layer heteroepitaxy. We give an empirical relation for the critical thickness which takes growth condi tions into account and allows the residual strain for layer thicknesse s exceeding the critical one to be estimated. Easy to use models for t he band edge energy and effective mass are presented, which are based on deformation potential and k.p theory. Monte Carlo calculations were employed to obtain a model for the anisotropic electron mobility. All models are given as functions of the independent parameters compositi on and strain which are no longer strictly coupled in the relaxed case .