D. Bardes et R. Alcubilla, ANALYTICAL MODELING OF BJT NEUTRAL BASE REGION UNDER VARIABLE INJECTION CONDITIONS, Solid-state electronics, 41(8), 1997, pp. 1177-1180
We present a set of closed form analytical solutions of the transport
equation in the base of bipolar transistors. The presented 1D solution
s hold for variable injection conditions, arbitrary doping profiles an
d arbitrary intrinsic carrier concentrations along the base, allowing
to consider bandgap narrowing effects and a variable composition base
(e.g. Si1-xGex graded base). The above solutions lay on the commonly u
sed assumption of zero majority carrier current in the neutral zone, a
nd are valid up to the onset of the Kirk effect. Two solutions are ana
lysed; the zero-order solution, found as a correction of the low injec
tion case, and the first order solution, derived as a correction of th
e zero-order case. The perturbative procedure can naturally be iterate
d leading to an exact solution, which is used to assess the accuracy o
f the proposed analytical solutions. The first-order solution shows th
e best trade-off between accuracy and complexity. (C) 1997 Elsevier Sc
ience Ltd.