A. Dargys et J. Kundrotas, DONOR AVALANCHE BREAKDOWN FIELD IN N-GAAS - EFFECT OF CONCENTRATION AND LATTICE TEMPERATURE, Solid-state electronics, 41(8), 1997, pp. 1185-1188
A threshold avalanche breakdown field associated with the impact ioniz
ation of shallow donors by hot electrons in n-GaAs is calculated from
the Boltzmann transport equation for various values of donor concentra
tion, compensation ratio and lattice temperature. At low and moderate
donor concentrations, N-D < 10(15) cm(-3), the results are in good agr
eement with the available experimental data. The curves on the avalanc
he breakdown field presented in this paper may be used in optimizing t
he operational characteristics of impurity-based cryogenic devices, su
ch as far-infrared photomultipliers. (C) 1997 Elsevier Science Ltd.