APPLICATION OF DYNAMIC SUPPLY CURRENT MONITORING TO TESTING MIXED-SIGNAL CIRCUITS

This paper applies the time-domain testing technique and compares the effectiveness of transient voltage and dynamic power supply current me asurements in detecting faults in CMOS mixed-signal circuits. The volt age and supply current (i(DDT)) measurements are analyzed by three met hods to detect the presence of a fault, and to establish which measure ment achieves higher confidence in the detection. Catastrophic, soft a nd stuck-at single fault conditions were introduced to the circuit-und er-test (CUT). The time-domain technique tests a mixed-signal CUT in a unified fashion, thereby eliminating the need to partition the CUT in to separate analogue and digital modules.