The mechanism responsible for nucleation of 3C polytype on off-axis 4H
and 6H substrates is investigated. 3C is shown to predominantly nucle
ate at triangular stacking faults (TSFs), the structural defects induc
ed by substrate imperfections. The TSFs suppress conventional step-flo
w growth and promote the development of large on-axis (0 0 0 1) terrac
es, The nucleation of 3C at those terraces occurs as a result of high
supersaturation, in a similar manner as for on-axis SIC wafers. Both t
he process parameters and the substrate quality are significant in pre
venting the 3C incorporation into epitaxial layers.