Structure and energetics of the interface between Si and amorphous SiO2

Authors
Tu, YH Tersoff, J
Citation
Yh. Tu et J. Tersoff, Structure and energetics of the interface between Si and amorphous SiO2, SPR S MAT S, 46, 2001, pp. 247-255
Categorie Soggetti
Current Book Contents","Current Book Contents
Journal title
FUNDAMENTAL ASPECTS OF SILICON OXIDATION → ACNP
ISSN journal
0933033X
Volume
46
Year of publication
2001
Pages
247 - 255
Database
ISI
SICI code
0933-033X(2001)46:<247:SAEOTI>2.0.ZU;2-Q