Monolayer scale analysis of heterostructures and interfaces by X-ray CTR scattering and interference

Authors
Takeda, Y Tabuchi, M
Citation
Y. Takeda et M. Tabuchi, Monolayer scale analysis of heterostructures and interfaces by X-ray CTR scattering and interference, OPTOEL PROP, 9, 2000, pp. 459-512
Categorie Soggetti
Current Book Contents
Journal title
INP AND RELATED COMPOUNDS : MATERIALS, APPLICATIONS AND DEVICES → ACNP
Volume
9
Year of publication
2000
Pages
459 - 512
Database
ISI
SICI code