Test scheduling is one of the hard optimization problems involved in a
ny VLSI design process. Depending on the overall design objectives, th
e objective of test scheduling may differ. Since it is computationally
infeasible to solve this problem optimally, different approximation s
chemes are employed for different objectives resulting in different fo
rmulations. In this paper we show that test scheduling with different
objective functions can be formulated and approximately solved in a co
mmon framework using genetic algorithms. The genetic algorithm is pres
ented and experimental results for three different formulations are sh
own. The results show that the proposed genetic algorithm provides a u
niform framework for obtaining near optimal solutions for the test sch
eduling problem with different objectives. Comparison with branch and
bound method solutions reveal the superiority of the genetic algorithm
.