C. Pautet et al., EFFECT OF METHYL SURFACE SATURATION DURING GROWTH INTERRUPTION SEQUENCES OF METALORGANIC VAPOR-PHASE EPITAXY OF IN0.53GA0.47AS USING TRIMETHYLARSENIC, Journal of crystal growth, 179(1-2), 1997, pp. 10-17
We have investigated the use of trimethylarsenic (TMAs) as an alternat
ive to arsine in the metal organic vapor-phase epitaxy (MOVPE) of hete
rostructures containing arsenic-based compounds on InP. We particularl
y. focused this study on the growth interruption sequences (GIS) betwe
en two arsenic-based materials rising TMAs. We show that a too long st
abilization time under TMAs is not desirable. It produces a saturation
of the surface with methyl radicals that hampers the growth of the se
cond material (after the GIS). This results in a very poor surface mor
phology of the sample, An important improvement of the surface morphol
ogy is achieved using a long hydrogen purge after the stabilization ti
me under TMAs. This allows the desorption of most of the methyl radica
ls on the surface before the growth of the second layer. However, even
with this hydrogen purge, the surface morphology is not perfect and p
resents some defects.