CRYSTAL-STRUCTURE AND POINT-DEFECTS OF GE1-BI2TE4(DELTA)

Citation
Og. Karpinskii et al., CRYSTAL-STRUCTURE AND POINT-DEFECTS OF GE1-BI2TE4(DELTA), Inorganic materials, 33(8), 1997, pp. 793-797
Citations number
14
Categorie Soggetti
Material Science
Journal title
ISSN journal
00201685
Volume
33
Issue
8
Year of publication
1997
Pages
793 - 797
Database
ISI
SICI code
0020-1685(1997)33:8<793:CAPOG>2.0.ZU;2-W
Abstract
The crystal structure of Ge1+/-deltaBi2Te4 is determined by single-cry stal x-ray diffraction. The carrier concentrations estimated from anal ysis of defect chemistry agree well with experimental values.