Pk. Baumann et Rj. Nemanich, COMPARISON OF ELECTRON-AFFINITY AND SCHOTTKY-BARRIER HEIGHT OF ZIRCONIUM AND COPPER-DIAMOND INTERFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1236-1240
In this study, the evolution from diamond surfaces to metal-diamond in
terfaces has been examined. The electron affinity and the Schottky bar
rier height of a few Angstrom thick films of Zr and Cu deposited in ul
trahigh vacuum (UHV) onto IIb substrates were correlated. Prior to met
al deposition, the diamond surfaces have been cleaned by different ann
eals and plasma treatments in UHV, and the surfaces were characterized
by Auger electron spectroscopy and atomic force microscopy. The initi
al surfaces were terminated with oxygen, or free of chemisorbed specie
s. Ultraviolet photoemission spectroscopy was employed to determine wh
ether the samples exhibited a positive electron affinity or a negative
electron affinity (NEA) before and after metal deposition. For Zr, th
e Schottky barrier height was found to change very little with the pre
sence or absence of chemisorbed species at the interface. A NEA was ob
served for Zr on diamond independent of the surface termination. Howev
er, for Cu, the surface cleaning prior to metal deposition had a more
significant effect. The Schottky barrier height changed strongly depen
ding on the chemical species at the interface. A NEA was only detected
for Cu on clean diamond surfaces. The differences between Zr on the o
ne hand and Cu on the other are correlated with differences in interfa
ce chemistry and structure. (C) 1997 American Vacuum Society.