The goal of this paper is to characterize the performance of an invert
ed vertical MOCVD reactor used for the deposition of titanium dioxide
thin films. Utilizing two-and three-dimensional numerical simulation t
o gain a more complete understanding of the fundamental relationships
underlying the epitaxial growth process, we develop a model to predict
gas velocity, temperature distribution, concentration of reactant gas
, and deposition rate. A 3D model is used to explain experimentally ob
served off-axis deposition of grown films. The model is also used to f
ind the control mechanism for different process conditions. Simulation
s are compared to experimental results, and excellent agreement is obt
ained.