EFFECT OF GROWTH-PARAMETERS ON TIO2 THIN-FILMS DEPOSITED USING MOCVD

Citation
Z. Nami et al., EFFECT OF GROWTH-PARAMETERS ON TIO2 THIN-FILMS DEPOSITED USING MOCVD, Journal of crystal growth, 179(3-4), 1997, pp. 522-538
Citations number
21
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
179
Issue
3-4
Year of publication
1997
Pages
522 - 538
Database
ISI
SICI code
0022-0248(1997)179:3-4<522:EOGOTT>2.0.ZU;2-B
Abstract
The goal of this paper is to characterize the performance of an invert ed vertical MOCVD reactor used for the deposition of titanium dioxide thin films. Utilizing two-and three-dimensional numerical simulation t o gain a more complete understanding of the fundamental relationships underlying the epitaxial growth process, we develop a model to predict gas velocity, temperature distribution, concentration of reactant gas , and deposition rate. A 3D model is used to explain experimentally ob served off-axis deposition of grown films. The model is also used to f ind the control mechanism for different process conditions. Simulation s are compared to experimental results, and excellent agreement is obt ained.