T. Shibataseki et al., IMAGING OF CELL WITH ATOMIC-FORCE MICROSCOPY OPERATED AT A TAPPING MODE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1530-1534
This paper reports direct imaging of cells with a new scanning mode fo
r atomic force microscopy (AFM), a tapping mode for AFM (TMAFM). Two k
inds of cells, Escherichia coli (E. coli) and cultured hamster ovary (
CHO) cells, prepared on indium tin oxide (ITO) glasses were observed i
n air. The TMAFM yielded very reproducible images without appreciable
modifications of the sample surfaces. The images were examined in two
modes of the data representation; normal height-mode and deflection-mo
de (similar to a first derivative of height-mode data) representations
. The deflection-mode image of the E. coli sample showed much finer su
rface details than the conventional height-mode one, while the height-
mode image of the CHO sample provided more detailed structure than the
deflection-mode one.