T. Hagen et al., FRICTION FORCE MICROSCOPY OF HEAVY-ION IRRADIATED MICA, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1555-1558
The effects of energetic heavy ions passing through a solid are reflec
ted in the size, shape, and structure of individual latent tracks. The
ir detailed study thus provides information on the primary processes o
f energy deposition, which results in bond breaking, lattice disruptio
n, and increased chemical reactivity. Furthermore, ion track cross sec
tions, being objects very limited in size, are well suited for studies
of material properties such as friction on a nanometer scale. The pre
sent work displays results of scanning force microscopy of mica, irrad
iated with 11.4 MeV/u Pb28+ and Xe21+ ions at the UNILAC heavy-ion acc
elerator of the Gesellschaft fur Schwerionenforschung. Their track dia
meters were determined to be 10.6 and 7.5 nm, respectively. Recording
topographical and lateral force data simultaneously allows one to quan
tify the contribution of friction to topographic images. In this way t
he kinetic friction coefficient of the sensor (Si3N4) on the sample (m
ica) was measured. It was found that the value obtained from the laten
t track area and from the intact mica lattice differ by a factor of 2.