FRICTION FORCE MICROSCOPY OF HEAVY-ION IRRADIATED MICA

Citation
T. Hagen et al., FRICTION FORCE MICROSCOPY OF HEAVY-ION IRRADIATED MICA, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1555-1558
Citations number
27
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
12
Issue
3
Year of publication
1994
Pages
1555 - 1558
Database
ISI
SICI code
1071-1023(1994)12:3<1555:FFMOHI>2.0.ZU;2-A
Abstract
The effects of energetic heavy ions passing through a solid are reflec ted in the size, shape, and structure of individual latent tracks. The ir detailed study thus provides information on the primary processes o f energy deposition, which results in bond breaking, lattice disruptio n, and increased chemical reactivity. Furthermore, ion track cross sec tions, being objects very limited in size, are well suited for studies of material properties such as friction on a nanometer scale. The pre sent work displays results of scanning force microscopy of mica, irrad iated with 11.4 MeV/u Pb28+ and Xe21+ ions at the UNILAC heavy-ion acc elerator of the Gesellschaft fur Schwerionenforschung. Their track dia meters were determined to be 10.6 and 7.5 nm, respectively. Recording topographical and lateral force data simultaneously allows one to quan tify the contribution of friction to topographic images. In this way t he kinetic friction coefficient of the sensor (Si3N4) on the sample (m ica) was measured. It was found that the value obtained from the laten t track area and from the intact mica lattice differ by a factor of 2.