K. Sueoka et al., STUDY OF MAGNETIC CHARACTERISTICS OF TIPS FOR MAGNETIC FORCE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1618-1622
The magnetic characteristics of magnetic force microscopy (MFM) tips w
ere studied by using several methods with a Lorentz transmission elect
ron microscope a magnetoresistive head, and a thin-film inductive head
. The results obtained indicate that high-resolution observation with
little disturbance of the sample's magnetic state can be achieved by u
sing a CoPtCr-coated MFM tip.