EFFECT OF MG(OH)2 ON YBA2CU3O7 THIN-FILM ON MGO SUBSTRATE STUDIED BY ATOMIC-FORCE MICROSCOPE

Citation
Bi. Kim et al., EFFECT OF MG(OH)2 ON YBA2CU3O7 THIN-FILM ON MGO SUBSTRATE STUDIED BY ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1631-1634
Citations number
5
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
12
Issue
3
Year of publication
1994
Pages
1631 - 1634
Database
ISI
SICI code
1071-1023(1994)12:3<1631:EOMOYT>2.0.ZU;2-H
Abstract
We observed the surface degradation of MgO single-crystal substrates s tored in humid air after cleavage by atomic force microscope. Annealin g at 1000-degrees-C in dry oxygen removed local defects though residua l subgrain structure remains. The morphology of YBa2Cu3O7-delta (YBCO) films on the annealed and degraded substrates reflects these changes of the substrates. We confirmed that the annealing process of degraded substrate improves the film quality by measuring transition temperatu re T(c) and critical current J(c) of each film.