ATOMIC-FORCE MICROSCOPY OF AMMONIUM-PERCHLORATE

Citation
Ms. Yoo et al., ATOMIC-FORCE MICROSCOPY OF AMMONIUM-PERCHLORATE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1638-1641
Citations number
12
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
12
Issue
3
Year of publication
1994
Pages
1638 - 1641
Database
ISI
SICI code
1071-1023(1994)12:3<1638:AMOA>2.0.ZU;2-X
Abstract
Ammonium perchlorate (NH4ClO4 or AP) is an insulating energetic materi al and is hygroscopic; the surface degrades easily by absorbing moistu re in ambient conditions. An ultrahigh vacuum (UHV) atomic-force micro scope (AFM) has been designed and built to study the (210) surface of AP in a moisture-free environment. Large-scale images from this appara tus show nanocracks and grains; cracks are mainly aligned with the dir ection that matches the main crystal steps and grains are plastically deformed by raster scans. Molecular scale images are taken on grains w ith a constant frictional force. Popping signals are observed in the f rictional-force mode which are about ten times larger than the topogra phy of the surrounding intrinsic surface structure. These signals are intermittent and increase in intensity and abundance as the same area is scanned repeatedly. It is speculated that these signals are caused by local reactions initiated by the increased pressure from the tip as it turns around at the end of each line scan.