Ms. Yoo et al., ATOMIC-FORCE MICROSCOPY OF AMMONIUM-PERCHLORATE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1638-1641
Ammonium perchlorate (NH4ClO4 or AP) is an insulating energetic materi
al and is hygroscopic; the surface degrades easily by absorbing moistu
re in ambient conditions. An ultrahigh vacuum (UHV) atomic-force micro
scope (AFM) has been designed and built to study the (210) surface of
AP in a moisture-free environment. Large-scale images from this appara
tus show nanocracks and grains; cracks are mainly aligned with the dir
ection that matches the main crystal steps and grains are plastically
deformed by raster scans. Molecular scale images are taken on grains w
ith a constant frictional force. Popping signals are observed in the f
rictional-force mode which are about ten times larger than the topogra
phy of the surrounding intrinsic surface structure. These signals are
intermittent and increase in intensity and abundance as the same area
is scanned repeatedly. It is speculated that these signals are caused
by local reactions initiated by the increased pressure from the tip as
it turns around at the end of each line scan.