F. Gao et al., NEWLY DEVELOPED LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE AND ITSAPPLICATION TO THE STUDY OF SUPERCONDUCTING MATERIALS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1708-1711
A newly developed scanning tunneling microscope (STM) capable of opera
ting at room temperature, 77 K, and 4.2 K is presented. This compact S
TM has a highly symmetric and rigid tunneling unit designed as an inte
gral frame except the coarse and fine adjustment parts. The tunneling
unit is incorporated into a small vacuum chamber that is usually pumpe
d down to 2X10(-4) Pa to avoid water contamination. The fine mechanic
adjustment makes the tip approach the sample in 5 nm steps. The coarse
adjustment not only changes the distance between the tip and the samp
le, but also adjusts the tip to be normal to the surface of the sample
. With this low-temperature STM atomic resolution images of Bi-2212 si
ngle-crystal and large-scale topographies of a YBa2Cu3O7 thin film are
observed at 77 K.