J. Masai et al., SURFACE CHARACTERIZATION OF FLEXIBLE MAGNETIC DISK WITH SCANNING PROBE MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1881-1886
Using scanning probe microscopy such as scanning tunneling microscopy
(STM), atomic force microscopy (AFM), and magnetic force microscopy (M
FM) as well as conventional scanning electron microscopy (SEM), the su
rface morphology and intentionally recorded magnetic bit pattern on th
e surface of a flexible magnetic disk have been investigated. Typical
images taken with SEM, STM, and AFM of acicular Co-gamma-Fe2O3 magneti
c particles and protrusions of abrasive aluminum particles appeared on
the disk surfaces are shown. Closer examination of the simultaneously
measured AFM images and MFM images at the same regions of the flexibl
e disk surfaces suggested that the nonuniform distribution of Co-gamma
-Fe2O3 magnetic particles and appearance of aluminum abrasive particle
s on the surface are major causes of the irregularity of magnetic bit
patterns in the MFM images. Showing those images, this paper demonstra
tes that the complementary use of SEM, STM, AFM, and MFM is very effec
tive to examine the above-mentioned surface characteristics in relatio
n to the friction and wear at a magnetic read/write head-disk interfac
e.