SCANNING-TUNNELING-MICROSCOPY OF ORDERED C-60 AND C-70 LAYERS ON AU(111), CU(111), AG(110), AND AU(110) SURFACES

Authors
GIMZEWSKI JK MODESTI S DAVID T SCHLITTLER RR
Citation
Jk. Gimzewski et al., SCANNING-TUNNELING-MICROSCOPY OF ORDERED C-60 AND C-70 LAYERS ON AU(111), CU(111), AG(110), AND AU(110) SURFACES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 1942-1946
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
12
Issue
3
Year of publication
1994
Pages
1942 - 1946
Database
ISI
SICI code
1071-1023(1994)12:3<1942:SOOCAC>2.0.ZU;2-V
Abstract
We have conducted a study of the growth of C60 and C70 on a variety of reconstructed and unreconstructed noble metal surfaces using a UHV sc anning tunneling microscope. For reconstructed Au(110) and Au(111) sur faces we observe changes in the superstructure of the metal upon (sub) monolayer adsorption at the fullerene-metal interface. In all the meta ls studied, formation of a well-ordered hexagonal C60 overlayer is obs erved after annealing. (110) and (111) substrates show preferred nucle ation and growth at terrace and steps, respectively. Time-lapsed image s illustrate mobility of C60 arrays and clusters. The role of tip-C60 interactions is elucidated by sequences of images and the prospects fo r manipulation is discussed.