Sm. Hues et al., MEASUREMENT OF NANOMECHANICAL PROPERTIES OF METALS USING THE ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2211-2214
The capability of the atomic force microscope (AFM) to quantitatively
measure the nanoscale mechanical properties of metals via nanoindentat
ion is illustrated with three single-crystal metals-chromium, molybden
um, and tungsten. Three distinct regions with differing elastic moduli
are found: (1) a low modulus for the outermost surface layer whose th
ickness scales with the degree of hydrocarbon surface contamination, (
2) a much higher modulus at a depth and thickness corresponding to the
native oxide layer; and (3) an intermediate modulus at larger depths
corresponding to the bulk modulus of the metal. In all cases, the modu
lus of the oxide is significantly larger than the bulk metal. Furtherm
ore, the AFM can be used to ''depth profile'' the oxide layer giving n
ew information about the sharpness of the oxide/metal interface.