FINITE-ELEMENT ANALYSIS OF PWB WARPAGE DUE TO THE SOLDER MASKING PROCESS

Citation
Ic. Ume et al., FINITE-ELEMENT ANALYSIS OF PWB WARPAGE DUE TO THE SOLDER MASKING PROCESS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(3), 1997, pp. 295-306
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
ISSN journal
10709886
Volume
20
Issue
3
Year of publication
1997
Pages
295 - 306
Database
ISI
SICI code
1070-9886(1997)20:3<295:FAOPWD>2.0.ZU;2-9
Abstract
Researchers have begun to examine the various manufacturing processes that a printed wiring board (PWB) undergoes during its production, suc h as lamination, solder masking, and soldering process to determine th eir impact on board warpage, The goal of this paper is to determine ef fects of the solder masking process on the PWB warpage,:Finite element analysis was used to study the effects of the solder masking process, in particular the curtain coating and curing processes on PWB warpage of four different board designs, These analyses have aided developmen t of general guidelines that should be observed when selecting solder masking material.