SPECIAL ISSUE ON EVOLUTION AND ADVANCED CHARACTERIZATION OF THIN-FILMMICROSTRUCTURES - FOREWORD

Authors
KVAM EP CHASON EH YALISOV SM
Citation
Ep. Kvam et al., SPECIAL ISSUE ON EVOLUTION AND ADVANCED CHARACTERIZATION OF THIN-FILMMICROSTRUCTURES - FOREWORD, Journal of electronic materials, 26(9), 1997, pp. 959-959
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
Journal title
Journal of electronic materials → ACNP
ISSN journal
03615235
Volume
26
Issue
9
Year of publication
1997
Pages
959 - 959
Database
ISI
SICI code
0361-5235(1997)26:9<959:SIOEAA>2.0.ZU;2-C