Jp. Sullivan et al., STRESS-RELAXATION AND THERMAL EVOLUTION OF FILM PROPERTIES IN AMORPHOUS-CARBON, Journal of electronic materials, 26(9), 1997, pp. 1021-1029
A model for the stress relaxation of amorphous carbon films containing
high concentrations of fourfold coordinated carbon is presented. The
onset of stress relaxation in these materials occurs following thermal
annealing at temperatures as low as 100 degrees C, and near full stre
ss relaxation occurs after annealing at 600 degrees C. The stress rela
xation is modeled by a series of first order chemical reactions which
lead to a conversion of some fourfold coordinated carbon atoms into th
reefold coordinated carbon atoms. The distribution of activation energ
ies for this process is derived from the experimental measurements of
stress relaxation and is found to range from 1 eV to over 3 eV. Perman
ent increases in the electrical conductivity of the carbon films are a
lso found following thermal annealing. The electrical conductivity is
found to be exponentially proportional to the number of additional thr
eefold atoms which are created upon annealing, with the increase in th
reefold atom concentration being deduced from the stress relaxation mo
del. This indicates that the increase in electrical conductivity and t
he stress relaxation originate from the same fourfold to threefold con
version process and that electrical transport through these films is d
ominated by a hopping conduction process.