FATIGUE-CREEP CRACK-PROPAGATION PATH IN SOLDER JOINTS UNDER THERMAL CYCLING

Authors
Citation
Dr. Liu et Yh. Pao, FATIGUE-CREEP CRACK-PROPAGATION PATH IN SOLDER JOINTS UNDER THERMAL CYCLING, Journal of electronic materials, 26(9), 1997, pp. 1058-1064
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
26
Issue
9
Year of publication
1997
Pages
1058 - 1064
Database
ISI
SICI code
0361-5235(1997)26:9<1058:FCPISJ>2.0.ZU;2-B
Abstract
The present study investigates the thermal fatigue crack propagation p ath in a eutectic solder joint between a 2512 leadless chip resistor a nd a printed wiring board which had experienced thermal cycling betwee n -55 and 125 degrees C. This was achieved through the microstructural examination of fractured surfaces of the joints. Patches of finely sp aced striations were observed in a predominant shear strain field in t he joints. These striations were attributed to the tensile strain comp onents in the field and used, to add the identification of the fatigue crack propagation direction. It was observed that cracks did not simp ly propagate across the depth of the joint from the inner end (the hee l) to the outer end (the toe) in the longitudinal direction, but from a corner point on the free edge of the heel to the center across the j oint depth, making an angle of about 70 degrees with respect to the lo ngitudinal direction.