K. Sangwal et al., AFM STUDY OF ETCHING OF CLEAVED (100)-FACES OF L-ARGININE PHOSPHATE MONOHYDRATE SINGLE-CRYSTALS .1. DISLOCATION ETCH PITS AND STEP BUNCHING, Journal of crystal growth, 180(2), 1997, pp. 263-273
The formation of dislocation etch pits and the process of coalescence
of dissolution steps composing the walls of dislocation etch pits on t
he etched {1 0 0} cleavage faces of L-arginine phosphate (LAP) single
crystals was studied by using atomic force microscopy (AFM). The resul
ts show that(1) etch pits at edge and screw dislocations are formed by
repeated two-dimensional nucleation mechanism, (2) the values of diff
erent slopes of etch pits in regions close to dislocation lines are du
e to differences in the stress fields of dislocations producing the et
ch pits, and that (3) the process of step bunching is statistical in n
ature.