Jm. Kuo et al., LARGE ARRAY OF GAAS MODULATORS AND DETECTORS FLIP-CHIP SOLDER BONDED TO SILICON CMOS USING INGAP AS THE SELECTIVE ETCH-STOP FOR GAAS SUBSTRATE REMOVAL, Journal of crystal growth, 175, 1997, pp. 971-976
We demonstrate the integration of a large (64 x 68) p-i(MQW)-n GaAs di
ode array to a silicon CMOS chip, using flip-chip solder bump bonding
techniques together with concomitant GaAs substrate removal. The capab
ility of removing a relatively large area of GaAs substrate cleanly an
d uniformly is attributed to the introduction of a new selective etch
stop with a smooth isotropic etchant for the GaAs substrate removal. T
he presence of the lattice matched In0.49Ga0.51P selective etch stop l
ayer has no detrimental effect on the performance of the GaAs/AlGaAs o
ptical detector/modulator diodes, which gives the chip the large I/O c
ount of 4352.