LARGE ARRAY OF GAAS MODULATORS AND DETECTORS FLIP-CHIP SOLDER BONDED TO SILICON CMOS USING INGAP AS THE SELECTIVE ETCH-STOP FOR GAAS SUBSTRATE REMOVAL

Citation
Jm. Kuo et al., LARGE ARRAY OF GAAS MODULATORS AND DETECTORS FLIP-CHIP SOLDER BONDED TO SILICON CMOS USING INGAP AS THE SELECTIVE ETCH-STOP FOR GAAS SUBSTRATE REMOVAL, Journal of crystal growth, 175, 1997, pp. 971-976
Citations number
13
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
175
Year of publication
1997
Part
2
Pages
971 - 976
Database
ISI
SICI code
0022-0248(1997)175:<971:LAOGMA>2.0.ZU;2-3
Abstract
We demonstrate the integration of a large (64 x 68) p-i(MQW)-n GaAs di ode array to a silicon CMOS chip, using flip-chip solder bump bonding techniques together with concomitant GaAs substrate removal. The capab ility of removing a relatively large area of GaAs substrate cleanly an d uniformly is attributed to the introduction of a new selective etch stop with a smooth isotropic etchant for the GaAs substrate removal. T he presence of the lattice matched In0.49Ga0.51P selective etch stop l ayer has no detrimental effect on the performance of the GaAs/AlGaAs o ptical detector/modulator diodes, which gives the chip the large I/O c ount of 4352.