LATERAL COUPLING OF INP GAINASP/INP STRUCTURES BY SELECTIVE-AREA MOMBE/

Citation
M. Wachter et al., LATERAL COUPLING OF INP GAINASP/INP STRUCTURES BY SELECTIVE-AREA MOMBE/, Journal of crystal growth, 175, 1997, pp. 1186-1194
Citations number
27
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
175
Year of publication
1997
Part
2
Pages
1186 - 1194
Database
ISI
SICI code
0022-0248(1997)175:<1186:LCOIGS>2.0.ZU;2-E
Abstract
Lateral couplings of InP/GaInAsP/InP structures selectively grown by m etalorganic molecular beam epitaxy (MOMBE) are presented. The heterost ructures were grown by either using the hydrides AsH3 and PH3 or terti arybutyl-phosphine and tertiarybutylarsine as group V precursors in a prototype multiwafer (MOMBE system. The base heterostructures of the f irst epitaxy were patterned with SiO2 mask stripes and trenches were r eactive-ion etched. Heterostructures were selectively filled in by a s econd growth run forming lateral heterojunctions of different quaterna ry materials. The structures exhibit a bright photoluminescence and a sharp transition at the boundary of the locally grown material indicat ing a high crystal quality up to the lateral junction with only a mino r change in the PL wavelength (< 2 nm). These optimized lateral coupli ngs were applied to laser/waveguide butt-couplings. Optical coupling l osses were determined by means of reactive-ion etched waveguides acros s cascades of coupled GaInAsP layers with an emission wavelength of la mbda(G) approximate to 1050 nm. Values as low as 0.12 dB/coupling were determined in cut-back measurements.