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Results: 26-50/223
Authors:
KJOLLE GH
HOLEN AT
Citation: Gh. Kjolle et At. Holen, RELIABILITY AND INTERRUPTION COST PREDICTION USING TIME-DEPENDENT FAILURE RATES AND INTERRUPTION COSTS, Quality and reliability engineering international, 14(3), 1998, pp. 159-165
Authors:
BLANKS HS
Citation: Hs. Blanks, THE CHALLENGE OF QUANTITATIVE RELIABILITY, Quality and reliability engineering international, 14(3), 1998, pp. 167-176
Authors:
MALIK Z
SU H
NELDER J
Citation: Z. Malik et al., INFORMATIVE EXPERIMENTAL-DESIGN FOR ELECTRONIC-CIRCUITS, Quality and reliability engineering international, 14(3), 1998, pp. 177-186
Authors:
OCONNOR P
Citation: P. Oconnor, QUALITY AND RELIABILITY ASPECTS OF PASSIVE COMPONENTS, Quality and reliability engineering international, 14(2), 1998, pp. 61-61
Authors:
MANCA JV
CROES K
DESCHEPPER L
DECEUNINCK W
STALS LM
JACQUES L
TIELEMANS L
GERRITS N
HOPPENER R
Citation: Jv. Manca et al., ELECTRICAL CHARACTERIZATION AND RELIABILITY EVALUATION OF CAPACITORS BY MEANS OF IN-SITU LEAKAGE CURRENT MEASUREMENTS, Quality and reliability engineering international, 14(2), 1998, pp. 63-68
Authors:
HASHIGUCHI S
YAMAGISHI Y
FUKUDA T
OHKI M
SIKULA J
VASINA P
Citation: S. Hashiguchi et al., GENERATION OF 1 F SPECTRUM BY RELAXATION PROCESS IN THIN-FILM RESISTORS/, Quality and reliability engineering international, 14(2), 1998, pp. 69-71
Authors:
ZEDNICEK T
SIKULA J
HRUSKA P
KOKTAVY B
VASINA P
KOKTAVY P
HASHIGUSHI S
Citation: T. Zednicek et al., POLARIZATION AND FLUCTUATION CHARACTERISTICS OF TANTALUM SOLID-ELECTROLYTE CAPACITORS, Quality and reliability engineering international, 14(2), 1998, pp. 73-77
Authors:
POZDEEV Y
Citation: Y. Pozdeev, RELIABILITY COMPARISON OF TANTALUM AND NIOBIUM SOLID ELECTROLYTIC CAPACITORS, Quality and reliability engineering international, 14(2), 1998, pp. 79-82
Authors:
KONCZAKOWSKA A
Citation: A. Konczakowska, 1 F NOISE OF ELECTROLYTIC CAPACITORS AS A RELIABILITY INDICATOR/, Quality and reliability engineering international, 14(2), 1998, pp. 83-85
Authors:
CROES K
DECEUNINCK W
DESCHEPPER L
TIELEMANS L
Citation: K. Croes et al., BIMODAL FAILURE BEHAVIOR OF METAL-FILM RESISTORS, Quality and reliability engineering international, 14(2), 1998, pp. 87-90
Authors:
OUSTEN Y
MEJDI S
BECHOU L
TREGON B
DANTO Y
Citation: Y. Ousten et al., COMPARISON BETWEEN PIEZOELECTRIC METHOD AND ULTRASONIC SIGNAL ANALYSIS FOR CRACK DETECTION IN TYPE-II MULTILAYER CERAMIC CAPACITORS, Quality and reliability engineering international, 14(2), 1998, pp. 91-94
Authors:
SCHWERTNER T
LEUTBECHER K
Citation: T. Schwertner et K. Leutbecher, OBTAINING MORE ACCURATE RESISTANCE MEASUREMENTS USING THE 6-WIRE OHMSMEASUREMENT TECHNIQUE, Quality and reliability engineering international, 14(2), 1998, pp. 95-102
Authors:
LU MW
Citation: Mw. Lu, AUTOMOTIVE RELIABILITY PREDICTION BASED ON EARLY FIELD FAILURE WARRANTY DATA, Quality and reliability engineering international, 14(2), 1998, pp. 103-108
Authors:
MALEC HA
Citation: Ha. Malec, ACCELERATED STRESS-TESTING, Quality and reliability engineering international, 14(1), 1998, pp. 1-1
Authors:
STRUTT JE
LOA WW
ALLSOPP K
Citation: Je. Strutt et al., PROGRESS TOWARDS THE DEVELOPMENT OF A MODEL FOR PREDICTING HUMAN RELIABILITY, Quality and reliability engineering international, 14(1), 1998, pp. 3-14
Authors:
PARKINSON DB
Citation: Db. Parkinson, SIMULATED VARIANCE OPTIMIZATION FOR ROBUST DESIGN, Quality and reliability engineering international, 14(1), 1998, pp. 15-21
Authors:
DELCASTILLO E
Citation: E. Delcastillo, A NOTE ON 2 PROCESS ADJUSTMENT MODELS, Quality and reliability engineering international, 14(1), 1998, pp. 23-28
Authors:
SWAN DA
SAVAGE GJ
Citation: Da. Swan et Gj. Savage, CONTINUOUS TAGUCHI - A MODEL-BASED APPROACH TO TAGUCHIS QUALITY BY DESIGN WITH ARBITRARY DISTRIBUTIONS, Quality and reliability engineering international, 14(1), 1998, pp. 29-41
Authors:
POLANSKY AM
Citation: Am. Polansky, A SMOOTH NONPARAMETRIC APPROACH TO PROCESS CAPABILITY, Quality and reliability engineering international, 14(1), 1998, pp. 43-48
Authors:
NELSON W
Citation: W. Nelson, AN APPLICATION OF GRAPHICAL ANALYSIS OF REPAIR DATA, Quality and reliability engineering international, 14(1), 1998, pp. 49-52
Authors:
JENSEN F
Citation: F. Jensen, CONFERENCES, Quality and reliability engineering international, 13(6), 1997, pp. 335-335
Authors:
TANG LC
THAN SE
ANG BW
Citation: Lc. Tang et al., A GRAPHICAL APPROACH TO OBTAINING CONFIDENCE-LIMITS OF C-PK, Quality and reliability engineering international, 13(6), 1997, pp. 337-346
Authors:
XIE M
HONG GY
WOHLIN C
Citation: M. Xie et al., A STUDY OF THE EXPONENTIAL SMOOTHING TECHNIQUE IN SOFTWARE-RELIABILITY GROWTH PREDICTION, Quality and reliability engineering international, 13(6), 1997, pp. 347-353
Authors:
CHEN KS
PEARN WL
Citation: Ks. Chen et Wl. Pearn, AN APPLICATION OF NONNORMAL PROCESS CAPABILITY INDEXES, Quality and reliability engineering international, 13(6), 1997, pp. 355-360
Authors:
BORROR CM
MONTGOMERY DC
RUNGER GC
Citation: Cm. Borror et al., CONFIDENCE-INTERVALS FOR VARIANCE-COMPONENTS FROM GAUGE CAPABILITY STUDIES, Quality and reliability engineering international, 13(6), 1997, pp. 361-369