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Authors: RINZLER AG LIU J DAI H NIKOLAEV P HUFFMAN CB RODRIGUEZMACIAS FJ BOUL PJ LU AH HEYMANN D COLBERT DT LEE RS FISCHER JE RAO AM EKLUND PC SMALLEY RE
Citation: Ag. Rinzler et al., LARGE-SCALE PURIFICATION OF SINGLE-WALL CARBON NANOTUBES - PROCESS, PRODUCT, AND CHARACTERIZATION, Applied physics A: Materials science & processing, 67(1), 1998, pp. 29-37

Authors: BERNHOLC J BRABEC C NARDELLI MB MAITI A ROLAND C YAKOBSON BI
Citation: J. Bernholc et al., THEORY OF GROWTH AND MECHANICAL-PROPERTIES OF NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 39-46

Authors: BOWER C SUZUKI S TANIGAKI K ZHOU O
Citation: C. Bower et al., SYNTHESIS AND STRUCTURE OF PRISTINE AND ALKALI-METAL-INTERCALATED SINGLE-WALLED CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 47-52

Authors: BERNAERTS D AMELINCKX S LAMBIN P LUCAS AA
Citation: D. Bernaerts et al., THE DIFFRACTION SPACE OF CIRCULAR AND POLYGONIZED MULTISHELL NANOTUBULES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 53-64

Authors: MINTMIRE JW WHITE CT
Citation: Jw. Mintmire et Ct. White, FIRST-PRINCIPLES BAND STRUCTURES OF ARMCHAIR NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 65-69

Authors: LEFEBVRE J ANTONOV R JOHNSON AT
Citation: J. Lefebvre et al., STM MORPHOLOGY STUDY OF ROPES OF SINGLE-WALL CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 71-74

Authors: BOZHKO AD SKLOVSKY DE NALIMOVA VA RINZLER AG SMALLEY RE FISCHER JE
Citation: Ad. Bozhko et al., RESISTANCE VS. PRESSURE OF SINGLE-WALL CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 75-77

Authors: CHARLIER JC ISSI JP
Citation: Jc. Charlier et Jp. Issi, ELECTRONIC-STRUCTURE AND QUANTUM TRANSPORT IN CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 79-87

Authors: EISEBITT S KARL A EBERHARDT W FISCHER JE SATHE C AGUI A NORDGREN J
Citation: S. Eisebitt et al., ELECTRONIC-STRUCTURE OF SINGLE-WALL CARBON NANOTUBES STUDIED BY RESONANT INELASTIC X-RAY-SCATTERING, Applied physics A: Materials science & processing, 67(1), 1998, pp. 89-93

Authors: SAITO Y HAMAGUCHI K UEMURA S UCHIDA K TASAKA Y IKAZAKI F YUMURA M KASUYA A NISHINA Y
Citation: Y. Saito et al., FIELD-EMISSION FROM MULTI-WALLED CARBON NANOTUBES AND ITS APPLICATIONTO ELECTRON-TUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 95-100

Authors: UGARTE D STOCKLI T BONARD JM CHATELAIN A DEHEER WA
Citation: D. Ugarte et al., FILLING CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 101-105

Authors: STEPHAN O BANDO Y LOISEAU A WILLAIME F SHRAMCHENKO N TAMIYA T SATO T
Citation: O. Stephan et al., FORMATION OF SMALL SINGLE-LAYER AND NESTED BN CAGES UNDER ELECTRON-IRRADIATION OF NANOTUBES AND BULK MATERIAL, Applied physics A: Materials science & processing, 67(1), 1998, pp. 107-111

Authors: JANTOLJAK H SALVETAT JP FORRO L THOMSEN C
Citation: H. Jantoljak et al., LOW-ENERGY RAMAN-ACTIVE PHONONS OF MULTIWALLED CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 113-116

Authors: DUESBERG GS MUSTER J KRSTIC V BURGHARD M ROTH S
Citation: Gs. Duesberg et al., CHROMATOGRAPHIC SIZE SEPARATION OF SINGLE-WALL CARBON NANOTUBES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 117-119

Authors: MIKULSKAS I LUTEROVA K TOMASIUNAS R HONERLAGE B CLOITRE T AULOMBARD RL
Citation: I. Mikulskas et al., LIGHT AMPLIFICATION DUE TO FREE AND LOCALIZED EXCITON-STATES IN ZNCDSE GRINSCH STRUCTURES, Applied physics A: Materials science & processing, 67(1), 1998, pp. 121-124

Authors: HORBER JKH
Citation: Jkh. Horber, SCANNING TUNNELING MICROSCOPY SPECTROSCOPY AND RELATED TECHNIQUES - PROCEEDINGS OF THE 9TH INTERNATIONAL-CONFERENCE - 20-25 JULY 1997, HAMBURG, GERMANY - PREFACE/, Applied physics A: Materials science & processing, 66, 1998, pp. 5-5

Authors: AVOURIS P MARTEL R HERTEL T SANDSTROM R
Citation: P. Avouris et al., AFM-TIP-INDUCED AND CURRENT-INDUCED LOCAL OXIDATION OF SILICON AND METALS, Applied physics A: Materials science & processing, 66, 1998, pp. 659-667

Authors: CUBERES MT SCHLITTLER RR GIMZEWSKI JK
Citation: Mt. Cuberes et al., MANIPULATION OF C-60 MOLECULES ON CU(111) SURFACES USING A SCANNING TUNNELING MICROSCOPE, Applied physics A: Materials science & processing, 66, 1998, pp. 669-673

Authors: LI JT SCHNEIDER WD BERNDT R
Citation: Jt. Li et al., LOW-TEMPERATURE MANIPULATION OF AG ATOMS AND CLUSTERS ON A AG(110) SURFACE, Applied physics A: Materials science & processing, 66, 1998, pp. 675-678

Authors: ENG LM ABPLANALP M GUNER P
Citation: Lm. Eng et al., FERROELECTRIC DOMAIN SWITCHING IN TRI-GLYCINE SULFATE AND BARIUM-TITANATE BULK SINGLE-CRYSTALS BY SCANNING FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 679-683

Authors: HARTWICH J DREESKORNFELD L HEISIG V RAHN S WEHMEYER O KLEINEBERG U HEINZMANN U
Citation: J. Hartwich et al., STM WRITING OF ARTIFICIAL NANOSTRUCTURES IN ULTRATHIN PMMA AND SAM RESISTS AND SUBSEQUENT PATTERN TRANSFER IN A MO SI MULTILAYER BY REACTIVE ION ETCHING/, Applied physics A: Materials science & processing, 66, 1998, pp. 685-688

Authors: HASUNUMA R KOMEDA T TOKUMOTO H
Citation: R. Hasunuma et al., INDENTATION EFFECTS ON ATOM MANIPULATION ON SI(111) SURFACES INVESTIGATED BY STM, Applied physics A: Materials science & processing, 66, 1998, pp. 689-693

Authors: HITOSUGI T HASHIZUME T HEIKE S WADA Y WATANABE S HASEGAWA T KITAZAWA K
Citation: T. Hitosugi et al., SCANNING TUNNELING SPECTROSCOPY OF DANGLING-BOND WIRES FABRICATED ON THE SI(100)-2X1-H SURFACE, Applied physics A: Materials science & processing, 66, 1998, pp. 695-699

Authors: RADOJKOVIC P SCHWARTZKOPFF M GABRIEL T HARTMANN E
Citation: P. Radojkovic et al., STM-ASSISTED MANIPULATION OF AG NANOPARTICLES, Applied physics A: Materials science & processing, 66, 1998, pp. 701-705

Authors: HU XM VONBLANCKENHAGEN P
Citation: Xm. Hu et P. Vonblanckenhagen, GENERATION AND ANALYSIS OF NANO-SCALE AL ISLANDS BY STM, Applied physics A: Materials science & processing, 66, 1998, pp. 707-710
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