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Table of contents of journal: *Optica Applicata

Results: 76-100/388

Authors: Nowak, J
Citation: J. Nowak, Hybrid lens of optimized aberration correction, OPT APPL, 30(2-3), 2000, pp. 213-229

Authors: Kowalczyk, M Martinez-Corral, M Rodriguez, CJZ
Citation: M. Kowalczyk et al., Nonlinear delayed fluorescence in confocal scanning microscopy. Point-spread-function analysis, OPT APPL, 30(2-3), 2000, pp. 231-238

Authors: Magiera, L Mulak, G Osinski, J
Citation: L. Magiera et al., Boundary diffraction wave as a phase filter correction tool, OPT APPL, 30(2-3), 2000, pp. 239-245

Authors: Masajada, J
Citation: J. Masajada, Gaussian beams with optical vortex of charge 2-and 3-diffraction by a half-plane and slit, OPT APPL, 30(2-3), 2000, pp. 247-256

Authors: Stepien, P
Citation: P. Stepien, Computer generated holograms versus synthetic diffraction gratings in optically variable devices, OPT APPL, 30(2-3), 2000, pp. 257-269

Authors: Nowak, J Masajada, J
Citation: J. Nowak et J. Masajada, Hybrid apochromatic lens, OPT APPL, 30(2-3), 2000, pp. 271-275

Authors: Chalasinska-Macukow, K Campos, J Yzuel, MJ
Citation: K. Chalasinska-macukow et al., Optical pattern recognition based on pure phase correlation, OPT APPL, 30(2-3), 2000, pp. 277-290

Authors: Millan, MS Perez, E Kotynski, R Chalasinska-Macukow, K
Citation: Ms. Millan et al., Optical correlator with variable discrimination capability - experimental results, OPT APPL, 30(2-3), 2000, pp. 291-302

Authors: Kotynski, R Chalasinska-Macukow, K
Citation: R. Kotynski et K. Chalasinska-macukow, BPOF composite filter optimized with a genetic algorithm, OPT APPL, 30(2-3), 2000, pp. 303-316

Authors: Jaroszewicz, LR Cyran, KA Podeszwa, T
Citation: Lr. Jaroszewicz et al., Optimized CGH-based pattern recognizer, OPT APPL, 30(2-3), 2000, pp. 317-333

Authors: Pniewski, J Szoplik, T
Citation: J. Pniewski et T. Szoplik, Compression of greyscale images based on sub-band decomposition using morphological filters, OPT APPL, 30(2-3), 2000, pp. 335-347

Authors: Niedziela, T Stankiewicz, A
Citation: T. Niedziela et A. Stankiewicz, Homographic wavelet analysis in identification of characteristic image features, OPT APPL, 30(2-3), 2000, pp. 349-359

Authors: Asghar, S Hayat, T
Citation: S. Asghar et T. Hayat, Diffraction by a perfectly conducting open-ended waveguide in a homogeneous biisotropic medium, OPT APPL, 30(2-3), 2000, pp. 361-373

Authors: Rajkowski, B Nowak, P
Citation: B. Rajkowski et P. Nowak, Modelling of acutance dye influence on the image sharpness in heterogenic light-sensitive layers, OPT APPL, 30(2-3), 2000, pp. 375-381

Authors: Zendzian, W
Citation: W. Zendzian, Optimization of energetic parameters of passively Q-switched lasers, OPT APPL, 30(2-3), 2000, pp. 383-399

Authors: Blahut, M
Citation: M. Blahut, Optical waveguide splitters based on multimode interference structures made by ion exchange in glass, OPT APPL, 30(2-3), 2000, pp. 401-413

Authors: Cojocaru, E
Citation: E. Cojocaru, Equivalence relations for the enhanced polar Kerr effect at normal incidence, OPT APPL, 30(2-3), 2000, pp. 415-419

Authors: Furlan, WD Munoz-Escriva, L Kowalczyk, M
Citation: Wd. Furlan et al., Jackson cross cylinder - simple formulation of its optical principles, OPT APPL, 30(2-3), 2000, pp. 421-429

Authors: Vankov, A Badziak, J
Citation: A. Vankov et J. Badziak, Self-phase modulation of temporary overlapped chirped pulses, OPT APPL, 30(2-3), 2000, pp. 431-442

Authors: Dulski, R Madura, H Niedziela, T Sikorski, Z
Citation: R. Dulski et al., Theoretical model of thermodetection system, OPT APPL, 30(2-3), 2000, pp. 443-453

Authors: Magiera, A
Citation: A. Magiera, Point spread function in a confocal microscope with trigonometric pupil filters, OPT APPL, 30(2-3), 2000, pp. 455-461

Authors: Godlewski, M
Citation: M. Godlewski, Exciton properties in quantum well structures of CdTe/CdMnTe, OPT APPL, 30(2-3), 2000, pp. 463-475

Authors: Badziak, J
Citation: J. Badziak, Untitled, OPT APPL, 30(1), 2000, pp. 3-3

Authors: Badziak, J
Citation: J. Badziak, High-peak-power lasers at the IPPLM, Warsaw, OPT APPL, 30(1), 2000, pp. 5-25

Authors: Wolowski, J
Citation: J. Wolowski, Study of laser-produced plasma by means of ion diagnostics at the IPPLM, Warsaw, OPT APPL, 30(1), 2000, pp. 27-40
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