Authors:
UNNO Y
TAKAHATA M
MAEOHMICHI H
HINODE F
AKAGI T
ASO T
DAIGO M
DEWITT J
DORFAN D
DUBBS T
FRAUTSCHI M
GRILLO A
HABER C
HANDA T
HATAKENAKA T
HUBBARD B
IWASAKI H
IWATA Y
KAPLAN D
KASHIGIN S
KIPNIS I
KOBAYASHI S
KOHRIKI T
KONDO T
KROEGER W
MATTHEWS J
MIYATA H
MURAKAMI A
NOBLE K
OSHAUGHNESSY K
OHMOTO T
OHSUGI T
OHYAMA H
PULLIAM T
RAHN J
ROWE WA
SADROZINSKI HFW
SEIDEN A
SIEGRIST J
SPENCER E
SPIELER H
TAKASHIMA R
TAMURA N
TERADA S
TEZUKA M
WEBSTER A
WICHMAN R
WILDER M
YOSHIKAWA M
Citation: Y. Unno et al., BEAM TESTS OF A DOUBLE-SIDED SILICON STRIP DETECTOR WITH FAST BINARY READOUT ELECTRONICS BEFORE AND AFTER PROTON-IRRADIATION, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 383(1), 1996, pp. 211-222