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Authors: AKKERMAN ZL SONG Y YIN Z SMITH FW GAT R

Citation: Zl. Akkerman et al., IN-SITU DETERMINATION OF THE SURFACE-ROUGHNESS OF DIAMOND FILMS USINGOPTICAL PYROMETRY, Applied physics letters, 72(8), 1998, pp. 903-905

Authors: AKKERMAN ZL EFSTATHIADIS H SMITH FW

Citation: Zl. Akkerman et al., THERMAL-STABILITY OF DIAMOND-LIKE CARBON-FILMS, Journal of applied physics, 80(5), 1996, pp. 3068-3075

Authors: AKKERMAN ZL KOSINOVA ML FAINER NI RUMJANTSEV YM SYSOEVA NP

Citation: Zl. Akkerman et al., CHEMICAL-STABILITY OF HYDROGEN-CONTAINING BORON-NITRIDE FILMS OBTAINED BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 260(2), 1995, pp. 156-160

Authors: AKKERMAN ZL KOSINOVA ML RUMYANTSEV YM SYSOEVA NP FAINER NI

Citation: Zl. Akkerman et al., DEHYDROGENATION OF BNX-H THIN-FILMS DURING HIGH-TEMPERATURE ANNEALING, Inorganic materials, 31(1), 1995, pp. 61-64