Authors: ALLERS W SCHWARZ A SCHWARZ UD WIESENDANGER R

Citation: W. Allers et al., SCANNING FORCE MICROSCOPE WITH ATOMIC-RESOLUTION IN ULTRAHIGH-VACUUM AND AT LOW-TEMPERATURES, Review of scientific instruments, 69(1), 1998, pp. 221-225

Authors: ALLERS W HAHN C LOHNDORF M LUKAS S PAN S SCHWARZ UD WIESENDANGER R

Citation: W. Allers et al., NANOMECHANICAL INVESTIGATIONS AND MODIFICATIONS OF THIN-FILMS BASED ON SCANNING FORCE METHODS, Nanotechnology, 7(4), 1996, pp. 346-350

Authors: WIESENDANGER R BODE M PASCAL R ALLERS W SCHWARZ UD

Citation: R. Wiesendanger et al., ISSUES OF ATOMIC-RESOLUTION STRUCTURE AND CHEMICAL-ANALYSIS BY SCANNING PROBE MICROSCOPY AND SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1161-1167

Authors: SCHWARZ UD ALLERS W GENSTERBLUM G PIREAUX JJ WIESENDANGER R

Citation: Ud. Schwarz et al., GROWTH OF C-60 THIN-FILMS ON GES(001) STUDIED BY SCANNING FORCE MICROSCOPY, Physical review. B, Condensed matter, 52(8), 1995, pp. 5967-5976

Authors: SCHWARZ UD ALLERS W GENSTERBLUM G WIESENDANGER R

Citation: Ud. Schwarz et al., LOW-LOAD FRICTION BEHAVIOR OF EPITAXIAL C-60 MONOLAYERS UNDER HERTZIAN CONTACT, Physical review. B, Condensed matter, 52(20), 1995, pp. 14976-14984

Authors: ALLERS W SCHWARZ UD GENSTERBLUM G WIESENDANGER R

Citation: W. Allers et al., SCANNING AND FRICTION-FORCE MICROSCOPY OF THIN C-60 FILMS ON GES(001), Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 11-15