Citation: P. Alluri et al., ECR-MOCVD OF THE BA-SR-TI-O SYSTEM BELOW 400-DEGREES-C - PART I - PROCESSING, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 305-318
Citation: Sk. Dey et al., ELECTRICAL-PROPERTIES OF PARAELECTRIC (PB0.72LA0.28)TIO3 THIN-FILMS WITH HIGH LINEAR DIELECTRIC PERMITTIVITY - SCHOTTKY AND OHMIC CONTACTS, JPN J A P 1, 34(6A), 1995, pp. 3142-3152
Citation: S. Dey et al., INFLUENCE OF SURFACES ON THE DIELECTRIC-PROPERTIES AND LEAKAGE CURRENTS IN PARAELECTRIC (PB0.72LA0.28)TIO3 THIN-FILMS, Integrated ferroelectrics, 7(1-4), 1995, pp. 341-352
Citation: Jj. Lee et al., EFFECT OF INTERFACES ON THE ELECTRICAL BEHAVIOR OF (PB0.72LA0.28)TIO3THIN-FILMS, Applied physics letters, 65(16), 1994, pp. 2027-2029