Authors: ALTET J RUBIO A DILHAIRE S SCHAUB E CLAEYS W

Citation: J. Altet et al., BICMOS THERMAL SENSOR CIRCUIT FOR BUILT-IN-TEST PURPOSES, Electronics Letters, 34(13), 1998, pp. 1307-1309

Authors: ALTET J RUBIO A

Citation: J. Altet et A. Rubio, BUILT-IN DYNAMIC THERMAL TESTING TECHNIQUE FOR ICS, Electronics Letters, 32(21), 1996, pp. 1982-1984