Authors: LIU ST ALLEN LP ANC MJ JENKINS WC HUGHES HL TWIGG ME LAWRENCE RK

Citation: St. Liu et al., REDUCTION OF RADIATION-INDUCED BACK CHANNEL THRESHOLD VOLTAGE SHIFTS IN PARTIALLY DEPLETED SIMOX CMOS DEVICES BY USING ADVANTOX(TM) SUBSTRATES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2101-2105

Authors: ANC MJ KRULL WA

Citation: Mj. Anc et Wa. Krull, SOURCES OF SIMOX BURIED OXIDE LEAKAGE, Microelectronic engineering, 28(1-4), 1995, pp. 407-410

Authors: MRSTIK BJ MCMARR PJ HUGHES HL ANC MJ KRULL WA

Citation: Bj. Mrstik et al., IMPROVEMENT IN ELECTRICAL-PROPERTIES OF BURIED SIO2 LAYERS BY HIGH-TEMPERATURE OXIDATION, Applied physics letters, 67(22), 1995, pp. 3283-3285