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Results:
1-7
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Results: 7
Authors:
SHETTY R
ARD CK
WALLACE JP
Citation: R. Shetty et al., APPLICATION OF EDDY-CURRENT TECHNIQUE TO VERTICAL BRIDGMAN GROWTH OF CDZNTE, Journal of electronic materials, 25(8), 1996, pp. 1134-1138
Authors:
MEYER JR
HOFFMAN CA
BARTOLI FJ
ANTOSZEWSKI J
FARAONE L
TOBIN SP
NORTON PW
ARD CK
REESE DJ
COLOMBO L
LIAO PK
Citation: Jr. Meyer et al., ADVANCED MAGNETOTRANSPORT CHARACTERIZATION OF LPE-GROWN HG1-XCDXTE BYQUANTITATIVE MOBILITY SPECTRUM ANALYSIS, Journal of electronic materials, 25(8), 1996, pp. 1157-1164
Authors:
TOWER JP
TOBIN SP
NORTON PW
BOLLONG AB
SOCHA A
TREGILGAS JH
ARD CK
ARLINGHAUS HF
Citation: Jp. Tower et al., TRACE COPPER MEASUREMENTS AND ELECTRICAL EFFECTS IN LPE HGCDTE, Journal of electronic materials, 25(8), 1996, pp. 1183-1187
Authors:
BOLLONG AB
FELDEWERTH G
TOWER JP
TOBIN SP
KESTIGIAN M
NORTON PW
SCHAAKE HF
ARD CK
Citation: Ab. Bollong et al., IMPURITY STUDY OF CDZNTE SUBSTRATES USED FOR LPE HGCDTE, Advanced materials for optics and electronics, 5(2), 1995, pp. 87-99
Authors:
TOWER JP
TOBIN SP
KESTIGIAN M
NORTON PW
BOLLONG AB
SCHAAKE HF
ARD CK
Citation: Jp. Tower et al., CDZNTE SUBSTRATE IMPURITIES AND THEIR EFFECTS ON LIQUID-PHASE EPITAXYHGCDTE, Journal of electronic materials, 24(5), 1995, pp. 497-504
ETCH PIT CHARACTERIZATION OF CDTE AND CDZNTE SUBSTRATES FOR USE IN MERCURY CADMIUM TELLURIDE EPITAXY
Authors:
EVERSON WJ
ARD CK
SEPICH JL
DEAN BE
NEUGEBAUER GT
SCHAAKE HF
Citation: Wj. Everson et al., ETCH PIT CHARACTERIZATION OF CDTE AND CDZNTE SUBSTRATES FOR USE IN MERCURY CADMIUM TELLURIDE EPITAXY, Journal of electronic materials, 24(5), 1995, pp. 505-510
Authors:
TOBIN SP
TOWER JP
NORTON PW
CHANDLERHOROWITZ D
AMIRTHARAJ PM
LOPES VC
DUNCAN WM
SYLLAIOS AJ
ARD CK
GILES NC
LEE J
BALASUBRAMANIAN R
BOLLONG AB
STEINER TW
THEWALT MLW
BOWEN DK
TANNER BK
Citation: Sp. Tobin et al., A COMPARISON OF TECHNIQUES FOR NONDESTRUCTIVE COMPOSITION MEASUREMENTS IN CDZNTE SUBSTRATES, Journal of electronic materials, 24(5), 1995, pp. 697-705
Risultati:
1-7
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