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Results: 1-25/37
Authors:
BJORKLUND RB
HEDLUND J
STERTE J
ARWIN H
Citation: Rb. Bjorklund et al., VAPOR ADSORPTION IN THIN SILICALITE-1 FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF PHYSICAL CHEMISTRY B, 102(12), 1998, pp. 2245-2250
Authors:
VANNOORT D
WELINKLINTSTROM S
ARWIN H
ZANGOOIE S
LUNDSTROM I
MANDENIUS CF
Citation: D. Vannoort et al., MONITORING SPECIFIC INTERACTION OF LOW-MOLECULAR-WEIGHT BIOMOLECULES ON OXIDIZED POROUS SILICON USING ELLIPSOMETRY, Biosensors & bioelectronics, 13(3-4), 1998, pp. 439-449
Authors:
ZANGOOIE S
JANSSON R
ARWIN H
Citation: S. Zangooie et al., REVERSIBLE AND IRREVERSIBLE CONTROL OF OPTICAL-PROPERTIES OF POROUS SILICON SUPERLATTICES BY THERMAL-OXIDATION, VAPOR ADSORPTION, AND LIQUID PENETRATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(5), 1998, pp. 2901-2912
Authors:
ZANGOOIE S
JANSSON R
ARWIN H
Citation: S. Zangooie et al., MICROSTRUCTURAL CONTROL OF POROUS SILICON BY ELECTROCHEMICAL ETCHING IN MIXED HCL HF SOLUTIONS/, Applied surface science, 136(1-2), 1998, pp. 123-130
Authors:
JARRENDAHL K
ARWIN H
Citation: K. Jarrendahl et H. Arwin, MULTIPLE SAMPLE ANALYSIS OF SPECTROSCOPIC ELLIPSOMETRY DATA OF SEMITRANSPARENT FILMS, Thin solid films, 313, 1998, pp. 114-118
Authors:
PETTERSSON LAA
CARLSSON F
INGANAS O
ARWIN H
Citation: Laa. Pettersson et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF THE OPTICAL-PROPERTIES OF DOPEDPOLY(3,4-ETHYLENEDIOXYTHIOPHENE) - AN ANISOTROPIC METAL, Thin solid films, 313, 1998, pp. 356-361
Authors:
ARWIN H
Citation: H. Arwin, SPECTROSCOPIC ELLIPSOMETRY AND BIOLOGY - RECENT DEVELOPMENTS AND CHALLENGES, Thin solid films, 313, 1998, pp. 764-774
Authors:
ZANGOOIE S
BJORKLUND R
ARWIN H
Citation: S. Zangooie et al., PROTEIN ADSORPTION IN THERMALLY OXIDIZED POROUS SILICON LAYERS, Thin solid films, 313, 1998, pp. 825-830
Authors:
PETTERSSON LAA
HULTMAN L
ARWIN H
Citation: Laa. Pettersson et al., POROSITY DEPTH PROFILING OF THIN POROUS SILICON LAYERS BY USE OF VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY - A POROSITY GRADED-LAYER, Applied optics, 37(19), 1998, pp. 4130-4136
Authors:
BJORKLUND RB
ZANGOOIE S
ARWIN H
Citation: Rb. Bjorklund et al., PLANAR PORE-FILLING - ADSORPTION IN POROUS SILICON, Advanced materials, 9(13), 1997, pp. 1067
Authors:
GUO S
ROCHOTZKI R
LUNDSTROM I
ARWIN H
Citation: S. Guo et al., ELLIPSOMETRIC SENSITIVITY TO HALOTHANE VAPORS OF HEXAMETHYLDISILOXANEPLASMA POLYMER-FILMS, Sensors and actuators. B, Chemical, 44(1-3), 1997, pp. 243-247
Authors:
ZANGOOIE S
BJORKLUND R
ARWIN H
Citation: S. Zangooie et al., VAPOR SENSITIVITY OF THIN POROUS SILICON LAYERS, Sensors and actuators. B, Chemical, 43(1-3), 1997, pp. 168-174
Authors:
BJORKLUND RB
ZANGOOIE S
ARWIN H
Citation: Rb. Bjorklund et al., ADSORPTION OF SURFACTANTS IN POROUS SILICON FILMS, Langmuir, 13(6), 1997, pp. 1440-1445
Authors:
GUO S
HEDBORG E
LUNDSTROM I
ARWIN H
Citation: S. Guo et al., AIR POCKETS IN THIN POROUS PLATINUM FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 293(1-2), 1997, pp. 179-184
Authors:
JOHANSSON N
DOSSANTOS DA
GUO S
CORNIL J
FAHLMAN M
SALBECK J
SCHENK H
ARWIN H
BREDAS JL
SALANEK WR
Citation: N. Johansson et al., ELECTRONIC-STRUCTURE AND OPTICAL-PROPERTIES OF ELECTROLUMINESCENT SPIRO-TYPE MOLECULES, The Journal of chemical physics, 107(7), 1997, pp. 2542-2549
Authors:
ZANGOOIE S
BJORKLUND R
ARWIN H
Citation: S. Zangooie et al., WATER INTERACTION WITH THERMALLY OXIDIZED POROUS SILICON LAYERS, Journal of the Electrochemical Society, 144(11), 1997, pp. 4027-4035
Authors:
JIN G
JANSSON R
ARWIN H
Citation: G. Jin et al., IMAGING ELLIPSOMETRY REVISITED - DEVELOPMENTS FOR VISUALIZATION OF THIN TRANSPARENT LAYERS ON SILICON SUBSTRATES, Review of scientific instruments, 67(8), 1996, pp. 2930-2936
Authors:
BJORKLUND RB
ZANGOOIE S
ARWIN H
Citation: Rb. Bjorklund et al., COLOR CHANGES IN THIN POROUS SILICON FILMS CAUSED BY VAPOR EXPOSURE, Applied physics letters, 69(20), 1996, pp. 3001-3003
Authors:
GUO S
LUNDSTROM I
ARWIN H
Citation: S. Guo et al., TEMPERATURE SENSITIVITY AND THERMAL-EXPANSION COEFFICIENT OF BENZOCYCLOBUTENE THIN-FILMS STUDIED WITH ELLIPSOMETRY, Applied physics letters, 68(14), 1996, pp. 1910-1912
Authors:
GUO SW
GUSTAFSSON G
HAGEL OJ
ARWIN H
Citation: Sw. Guo et al., DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF THICK TRANSPARENT FILMS BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY - APPLICATION TO BENZOCYCLOBUTENE FILMS, Applied optics, 35(10), 1996, pp. 1693-1699
Authors:
BERGSTROM L
MEURK N
ARWIN H
ROWCLIFFE DJ
Citation: L. Bergstrom et al., ESTIMATION OF HAMAKER CONSTANTS OF CERAMIC MATERIALS FROM OPTICAL-DATA USING LIFSHITZ THEORY, Journal of the American Ceramic Society, 79(2), 1996, pp. 339-348
Authors:
HEIM M
ARWIN H
CHEN J
POMPE R
Citation: M. Heim et al., DETERMINATION OF OXIDE THICKNESS ON AN SI2N2O-ZRO2 COMPOSITE BY SPECTROSCOPIC ELLIPSOMETRY, Journal of the European Ceramic Society, 15(4), 1995, pp. 313-318
Authors:
ODBERG L
SANDBERG S
WELINKLINTSTROM S
ARWIN H
Citation: L. Odberg et al., THICKNESS OF ADSORBED LAYERS OF HIGH-MOLECULAR-WEIGHT POLYELECTROLYTES STUDIED BY ELLIPSOMETRY, Langmuir, 11(7), 1995, pp. 2621-2625
Authors:
MARTENSSON J
ARWIN H
Citation: J. Martensson et H. Arwin, INTERPRETATION OF SPECTROSCOPIC ELLIPSOMETRY DATA ON PROTEIN LAYERS ON GOLD INCLUDING SUBSTRATE-LAYER INTERACTIONS, Langmuir, 11(3), 1995, pp. 963-968
ADSORPTION AND OPTICAL-PROPERTIES OF FERRITIN LAYERS ON GOLD STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY
Authors:
MARTENSSON J
ARWIN H
NYGREN H
LUNDSTROM I
Citation: J. Martensson et al., ADSORPTION AND OPTICAL-PROPERTIES OF FERRITIN LAYERS ON GOLD STUDIED WITH SPECTROSCOPIC ELLIPSOMETRY, Journal of colloid and interface science, 174(1), 1995, pp. 79-85