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Results: 1-25 | 26-31 |
Results: 26-31/31
MEASUREMENT OF THE THICKNESS OF DIELECTRIC THIN-FILMS ON SILICON PHOTODETECTORS USING THE ANGULAR RESPONSE TO INCIDENT LINEARLY POLARIZED-LIGHT
Authors: AZZAM RMA HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, MEASUREMENT OF THE THICKNESS OF DIELECTRIC THIN-FILMS ON SILICON PHOTODETECTORS USING THE ANGULAR RESPONSE TO INCIDENT LINEARLY POLARIZED-LIGHT, IEEE transactions on instrumentation and measurement, 43(6), 1994, pp. 799-802
POLARIZED-LIGHT REFLECTOMETER
Authors: AZZAM RMA
Citation: Rma. Azzam, POLARIZED-LIGHT REFLECTOMETER, Applied optics, 33(25), 1994, pp. 6009-6011
PHOTOPOLARIMETER BASED ON PLANAR GRATING DIFFRACTION
Authors: AZZAM RMA GIARDINA KA
Citation: Rma. Azzam et Ka. Giardina, PHOTOPOLARIMETER BASED ON PLANAR GRATING DIFFRACTION, Journal of the Optical Society of America. A: Optics and image science, 10(6), 1993, pp. 1190-1196
CREATION OF AN OPTICAL XYZ COORDINATE SYSTEM USING BIDIRECTIONAL BLAZING FROM A SYMMETRICAL TRIANGULAR-GROOVE GRATING IN A CONICAL DIFFRACTION MOUNT
Authors: AZZAM RMA FORGALA GW
Citation: Rma. Azzam et Gw. Forgala, CREATION OF AN OPTICAL XYZ COORDINATE SYSTEM USING BIDIRECTIONAL BLAZING FROM A SYMMETRICAL TRIANGULAR-GROOVE GRATING IN A CONICAL DIFFRACTION MOUNT, Optics letters, 18(24), 1993, pp. 2162-2164
MULTICHANNEL POLARIZATION STATE DETECTORS FOR TIME-RESOLVED ELLIPSOMETRY
Authors: AZZAM RMA
Citation: Rma. Azzam, MULTICHANNEL POLARIZATION STATE DETECTORS FOR TIME-RESOLVED ELLIPSOMETRY, Thin solid films, 234(1-2), 1993, pp. 371-374
POLARIZATION MICHELSON INTERFEROMETER AS A GLOBAL POLARIZATION STATE GENERATOR AND FOR MEASUREMENT OF THE COHERENCE AND SPECTRAL PROPERTIESOF QUASI-MONOCHROMATIC LIGHT
Authors: AZZAM RMA
Citation: Rma. Azzam, POLARIZATION MICHELSON INTERFEROMETER AS A GLOBAL POLARIZATION STATE GENERATOR AND FOR MEASUREMENT OF THE COHERENCE AND SPECTRAL PROPERTIESOF QUASI-MONOCHROMATIC LIGHT, Review of scientific instruments, 64(10), 1993, pp. 2834-2837
Risultati: 1-25 | 26-31 |