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Results:
1-8
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Results: 8
Authors:
Adamcyk, M
Tixier, S
Ruck, BJ
Schmid, JH
Tiedje, T
Fink, V
Jeffries, M
Karaiskaj, D
Kavanagh, KL
Thewalt, M
Citation: M. Adamcyk et al., Faceting transition in epitaxial growth of dilute GaNAs films on GaAs, J VAC SCI B, 19(4), 2001, pp. 1417-1421
Authors:
Ballestad, A
Ruck, BJ
Adamcyk, M
Pinnington, T
Tiedje, T
Citation: A. Ballestad et al., Evidence from the surface morphology for nonlinear growth of epitaxial GaAs films, PHYS REV L, 86(11), 2001, pp. 2377-2380
Authors:
Adamcyk, M
Ballestad, A
Pinnington, T
Tiedje, T
Davies, M
Feng, Y
Citation: M. Adamcyk et al., Smoothing of textured GaAs surfaces during molecular beam epitaxy growth, J VAC SCI B, 18(3), 2000, pp. 1488-1492
Authors:
Adamcyk, M
Pinnington, T
Ballestad, A
Tiedje, T
Citation: M. Adamcyk et al., Effect of the starting surface on the morphology of MBE-grown GaAs, MAT SCI E B, 75(2-3), 2000, pp. 153-156
Authors:
Sfigakis, F
Paddon, P
Pacradouni, V
Adamcyk, M
Nicoll, C
Cowan, AR
Tiedje, T
Young, JF
Citation: F. Sfigakis et al., Near-infrared refractive index of thick, laterally oxidized AlGaAs cladding layers, J LIGHTW T, 18(2), 2000, pp. 199-202
Authors:
Adamcyk, M
Nicoll, C
Pinnington, T
Tiedje, T
Eisebitt, S
Karl, A
Scherer, R
Eberhardt, W
Citation: M. Adamcyk et al., Coherent soft x-ray scattering from InP islands on a semiconductor substrate, J VAC SCI B, 17(4), 1999, pp. 1728-1732
Authors:
Adamcyk, M
Eisebitt, S
Karl, A
Nicoll, C
Pinnington, T
Scherer, R
Tiedje, T
Eberhardt, W
Citation: M. Adamcyk et al., Surface roughness and resonant scattering effects in soft X-ray speckle from random semiconductor interfaces, SURF REV L, 6(6), 1999, pp. 1121-1128
Authors:
Beaudoin, M
Adamcyk, M
Levy, Y
MacKenzie, JA
Ritchie, S
Tiedje, T
Gelbart, Z
Giesen, U
Kelson, I
Citation: M. Beaudoin et al., In situ real time monitoring of thickness and composition in MBE using alpha particle energy loss, J CRYST GR, 202, 1999, pp. 26-30
Risultati:
1-8
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