Authors: Shaer, B Landis, D Al-Arian, SA

Citation: B. Shaer et al., Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSIcircuits, IEEE VLSI, 8(6), 2000, pp. 750-754

Authors: Shaer, B Al-Arian, SA Landis, D

Citation: B. Shaer et al., Partitioning sequential circuits for pseudoexhaustive testing, IEEE VLSI, 8(5), 2000, pp. 534-541