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Results: 2
Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSIcircuits
Authors:
Shaer, B Landis, D Al-Arian, SA
Citation:
B. Shaer et al., Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSIcircuits, IEEE VLSI, 8(6), 2000, pp. 750-754
Partitioning sequential circuits for pseudoexhaustive testing
Authors:
Shaer, B Al-Arian, SA Landis, D
Citation:
B. Shaer et al., Partitioning sequential circuits for pseudoexhaustive testing, IEEE VLSI, 8(5), 2000, pp. 534-541
Risultati:
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