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Results:
1-7
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Results: 7
Authors:
Senzaki, Y
Alers, GB
Hochberg, AK
Roberts, DA
Norman, JAT
Fleming, RM
Krautter, H
Citation: Y. Senzaki et al., CVD of Zr-Sn-Ti-O thin films by direct injection of solventless liquid precursor mixtures, EL SOLID ST, 3(9), 2000, pp. 435-436
Authors:
Fleming, RM
Lang, DV
Jones, CDW
Steigerwald, ML
Murphy, DW
Alers, GB
Wong, YH
van Dover, RB
Kwo, JR
Sergent, AM
Citation: Rm. Fleming et al., Defect dominated charge transport in amorphous Ta2O5 thin films, J APPL PHYS, 88(2), 2000, pp. 850-862
Authors:
Ellis, KA
van Dover, RB
Klemmer, TJ
Alers, GB
Citation: Ka. Ellis et al., Magnetically transduced surface acoustic wave devices, J APPL PHYS, 87(9), 2000, pp. 6304-6306
Authors:
Nguyen, NV
Richter, CA
Cho, YJ
Alers, GB
Stirling, LA
Citation: Nv. Nguyen et al., Effects of high-temperature annealing on the dielectric function of Ta2O5 films observed by spectroscopic ellipsometry, APPL PHYS L, 77(19), 2000, pp. 3012-3014
Authors:
Breeze, AJ
Carter, SA
Alers, GB
Heaney, MB
Citation: Aj. Breeze et al., 1/f noise through the metal-nonmetal transition in percolating composites, APPL PHYS L, 76(5), 2000, pp. 592-594
Authors:
Chang, JP
Opila, RL
Alers, GB
Steigerwald, ML
Lu, HC
Garfunkel, E
Gustafsson, T
Citation: Jp. Chang et al., Interfacial reaction and thermal stability of Ta2O5/TiN for metal electrode capacitors, SOL ST TECH, 42(2), 1999, pp. 43
Authors:
Chang, JP
Steigerwald, ML
Fleming, RM
Opila, RL
Alers, GB
Citation: Jp. Chang et al., Thermal stability of Ta2O5 in metal-oxide-metal capacitor structures, APPL PHYS L, 74(24), 1999, pp. 3705-3707
Risultati:
1-7
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