Authors:
Draghici, M
Miu, M
Iancu, V
Nassiopoulou, A
Kleps, I
Angelescu, A
Ciurea, ML
Citation: M. Draghici et al., Oxidation-induced modifications of trap parameters in nanocrystalline porous silicon, PHYS ST S-A, 182(1), 2000, pp. 239-243
Citation: I. Kleps et A. Angelescu, LPCVD amorphous silicon carbide films, properties and microelectronics applications, J PHYS IV, 9(P8), 1999, pp. 1115-1122