AAAAAA
Results:
1-8
|
Results: 8
Authors:
Kumar, S
Raju, VS
Shekhar, R
Arunachalam, J
Khanna, AS
Prasad, KG
Citation: S. Kumar et al., Compositional characterization of CrN films deposited by ion beam-assisteddeposition process on stainless steel, THIN SOL FI, 388(1-2), 2001, pp. 195-200
Authors:
Karunasagar, D
Arunachalam, J
Citation: D. Karunasagar et J. Arunachalam, Determination of cadmium by inductively coupled plasma mass spectrometry-reduction of molybdenum oxide interferences by addition of acetonitrile, ANALYT CHIM, 441(2), 2001, pp. 291-296
Authors:
Karunasagar, D
Dash, K
Chandrasekaran, K
Arunachalam, J
Citation: D. Karunasagar et al., ICP-MS determination of trace amounts of boron in high-purity quartz, ATOM SPECT, 21(6), 2000, pp. 216-219
Authors:
Dewakar,"Mishra, KN
Chandra, K
Arunachalam, J
Karunasagar, D
Citation: Kn. Dewakar,"mishra et al., Isotopic fractionation of Ni-60/Ni-61 in kerogen and bitumen samples, CURRENT SCI, 79(12), 2000, pp. 1720-1723
Authors:
Raoot, S
Desikan, NR
Shekhar, R
Arunachalam, J
Citation: S. Raoot et al., Application of a longer pathlength infrared cell for the determination of TiOCl2 in TiCl4, APPL SPECTR, 54(9), 2000, pp. 1412-1415
Authors:
Krishna, MVB
Shekhar, R
Karunasagar, D
Arunachalam, J
Citation: Mvb. Krishna et al., Multi-element characterization of high purity cadmium using inductively coupled plasma quadrupole mass spectrometry and glow-discharge quadrupole mass spectrometry, ANALYT CHIM, 408(1-2), 2000, pp. 199-207
Authors:
Krishna, MVB
Karunasagar, D
Arunachalam, J
Citation: Mvb. Krishna et al., Studies on the determination of trace elements in high-purity Sb using GFAAS and ICP-QMS, FRESEN J AN, 363(4), 1999, pp. 353-358
Authors:
Shekhar, R
Krishna, MVB
Arunachalam, J
Gangadharan, S
Citation: R. Shekhar et al., Analysis of high purity antimony by glow discharge quadrupole mass spectrometry, ATOM SPECT, 20(1), 1999, pp. 25-29
Risultati:
1-8
|