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Results:
1-18
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Results: 18
Authors:
Arwin, H
Citation: H. Arwin, Is ellipsometry suitable for sensor applications?, SENS ACTU-A, 92(1-3), 2001, pp. 43-51
Authors:
Bukaluk, A
Wronkowska, AA
Wronkowski, A
Arwin, H
Firszt, F
Legowski, S
Meczynska, H
Citation: A. Bukaluk et al., Auger electron spectroscopy, ellipsometry and photoluminescence investigations of Zn1-xBexSe alloys, APPL SURF S, 175, 2001, pp. 531-537
Authors:
Wongmanerod, C
Zangooie, S
Arwin, H
Citation: C. Wongmanerod et al., Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry, APPL SURF S, 172(1-2), 2001, pp. 117-125
Authors:
Wronkowska, AA
Wronkowski, A
Arwin, H
Firszt, F
Legowski, S
Meczynska, H
Szatkowski, J
Citation: Aa. Wronkowska et al., Characterisation of Cd1-xMgxSe solid solutions by spectroscopic ellipsometry, VACUUM, 63(1-2), 2001, pp. 233-239
Authors:
Jansson, R
Zangooie, S
Kugler, T
Arwin, H
Citation: R. Jansson et al., Optical and microstructural characterization of thin films of photochromicfulgides, J PHYS CH S, 62(7), 2001, pp. 1219-1228
Authors:
Zangooie, S
Arwin, H
Citation: S. Zangooie et H. Arwin, Surface, pore morphology, and optical properties of porous 4H-SiC, J ELCHEM SO, 148(6), 2001, pp. G297-G302
Authors:
Zangooie, S
Woollam, JA
Arwin, H
Citation: S. Zangooie et al., Self-organization in porous 6H-SiC, J MATER RES, 15(9), 2000, pp. 1860-1863
Authors:
Jansson, R
Zangooie, S
Arwin, H
Jarrendahl, K
Citation: R. Jansson et al., Characterization of 3C-SiC by spectroscopic ellipsometry, PHYS ST S-B, 218(1), 2000, pp. R1-R2
Authors:
Arwin, H
Citation: H. Arwin, Ellipsometry on thin organic layers of biological interest: characterization and applications, THIN SOL FI, 377, 2000, pp. 48-56
Authors:
Johansen, K
Arwin, H
Lundstrom, I
Liedberg, B
Citation: K. Johansen et al., Imaging surface plasmon resonance sensor based on multiple wavelengths: Sensitivity considerations, REV SCI INS, 71(9), 2000, pp. 3530-3538
Authors:
Zangooie, S
Arwin, H
Citation: S. Zangooie et H. Arwin, Porous anodic 4H-SiC: Thickness dependent anisotropy in pore propagation and ellipsometric characterization, PHYS ST S-A, 182(1), 2000, pp. 213-219
Authors:
Arwin, H
Gavutis, M
Gustafsson, J
Schultzberg, M
Zangooie, S
Tengvall, P
Citation: H. Arwin et al., Protein adsorption in thin porous silicon layers, PHYS ST S-A, 182(1), 2000, pp. 515-520
Authors:
Zangooie, S
Persson, POA
Hilfiker, JN
Hultman, L
Arwin, H
Citation: S. Zangooie et al., Microstructural and infrared optical properties of electrochemically etched highly doped 4H-SiC, J APPL PHYS, 87(12), 2000, pp. 8497-8503
Authors:
Arwin, H
Citation: H. Arwin, Ellipsometry, PHYSICAL CHEMISTRY OF BIOLOGICAL INTERFACES, 2000, pp. 577-607
Authors:
Zangooie, S
Jansson, R
Arwin, H
Citation: S. Zangooie et al., Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry, J MATER RES, 14(11), 1999, pp. 4167-4175
Authors:
Pettersson, LAA
Johansson, T
Carlsson, F
Arwin, H
Inganas, O
Citation: Laa. Pettersson et al., Anisotropic optical properties of doped poly(3,4-ethylenedioxythiophene), SYNTH METAL, 101(1-3), 1999, pp. 198-199
Authors:
Wronkowska, AA
Wronkowski, A
Arwin, H
Citation: Aa. Wronkowska et al., Pd-induced effects in the electronic structure of thin Cu and Au films, VACUUM, 54(1-4), 1999, pp. 167-172
Authors:
Zangooie, S
Jansson, R
Arwin, H
Citation: S. Zangooie et al., Ellipsometric characterization of anisotropic porous silicon Fabry-Perot filters and investigation of temperature effects on capillary condensation efficiency, J APPL PHYS, 86(2), 1999, pp. 850-858
Risultati:
1-18
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