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Results: 1-10 |
Results: 10
MECHANICAL-PROPERTIES OF EWE VERTEBRAL CANCELLOUS BONE COMPARED WITH HISTOMORPHOMETRY AND HIGH-RESOLUTION COMPUTED-TOMOGRAPHY PARAMETERS
Authors: MITTON D CENDRE E ROUX JP ARLOT ME PEIX G RUMELHART C BABOT D MEUNIER PJ
Citation: D. Mitton et al., MECHANICAL-PROPERTIES OF EWE VERTEBRAL CANCELLOUS BONE COMPARED WITH HISTOMORPHOMETRY AND HIGH-RESOLUTION COMPUTED-TOMOGRAPHY PARAMETERS, Bone, 22(6), 1998, pp. 651-658
ESTIMATES OF GENETIC-PARAMETERS FOR LITTER SIZE AT DIFFERENT PARITIESIN PIGS
Authors: ALFONSO L NOGUERA JL BABOT D ESTANY J
Citation: L. Alfonso et al., ESTIMATES OF GENETIC-PARAMETERS FOR LITTER SIZE AT DIFFERENT PARITIESIN PIGS, Livestock production science, 47(2), 1997, pp. 149-156
AUTOMATIC RECOGNITION OF DEFECTS INSIDE ALUMINUM INGOTS BY X-RAY-IMAGING
Authors: KAFTANDJIAN V ZHU YM PEIX G BABOT D
Citation: V. Kaftandjian et al., AUTOMATIC RECOGNITION OF DEFECTS INSIDE ALUMINUM INGOTS BY X-RAY-IMAGING, Insight, 38(9), 1996, pp. 618-625
CONTRAST TRANSFER-FUNCTION MEASUREMENT OF X-RAY SOLID-STATE LINEAR DETECTORS USING BAR SPACE PATTERN METHODS/
Authors: KAFTANDJIAN V ZHU YM PEIX G BABOT D
Citation: V. Kaftandjian et al., CONTRAST TRANSFER-FUNCTION MEASUREMENT OF X-RAY SOLID-STATE LINEAR DETECTORS USING BAR SPACE PATTERN METHODS/, NDT & E international, 29(1), 1996, pp. 3-11
X-RAY COMPTON BACKSCATTERING TECHNIQUES FOR PROCESS TOMOGRAPHY - IMAGING AND CHARACTERIZATION OF MATERIALS
Authors: ZHU P DUVAUCHELLE P PEIX G BABOT D
Citation: P. Zhu et al., X-RAY COMPTON BACKSCATTERING TECHNIQUES FOR PROCESS TOMOGRAPHY - IMAGING AND CHARACTERIZATION OF MATERIALS, Measurement science & technology, 7(3), 1996, pp. 281-286
IN-LINE DENSITY-MEASUREMENT SYSTEM USING X-RAY COMPTON-SCATTERING
Authors: ZHU P PEIX G BABOT D MULLER J
Citation: P. Zhu et al., IN-LINE DENSITY-MEASUREMENT SYSTEM USING X-RAY COMPTON-SCATTERING, NDT & E international, 28(1), 1995, pp. 3-7
3-LEVEL CHARGE-PUMPING STUDY OF RADIATION-INDUCED DEFECTS AT SI-SIO2 INTERFACE IN SUBMICROMETER MOS-TRANSISTORS
Authors: AUTRAN JL BALLAND B BABOT D
Citation: Jl. Autran et al., 3-LEVEL CHARGE-PUMPING STUDY OF RADIATION-INDUCED DEFECTS AT SI-SIO2 INTERFACE IN SUBMICROMETER MOS-TRANSISTORS, Journal of non-crystalline solids, 187, 1995, pp. 211-215
MODULATION TRANSFER-FUNCTION EVALUATION OF LINEAR SOLID-STATE X-RAY-SENSITIVE DETECTORS USING EDGE TECHNIQUES
Authors: ZHU YM KAFTANDJIAN V PEIX G BABOT D
Citation: Ym. Zhu et al., MODULATION TRANSFER-FUNCTION EVALUATION OF LINEAR SOLID-STATE X-RAY-SENSITIVE DETECTORS USING EDGE TECHNIQUES, Applied optics, 34(22), 1995, pp. 4937-4943
CHARGE-PUMPING STUDY OF RADIATION-INDUCED DEFECTS AT SI-SIO2 INTERFACE
Authors: AUTRAN JL BALLAND B VALLARD JP BABOT D
Citation: Jl. Autran et al., CHARGE-PUMPING STUDY OF RADIATION-INDUCED DEFECTS AT SI-SIO2 INTERFACE, Journal de physique. III, 4(9), 1994, pp. 1707-1721
X-RAY COHERENT SCATTER IN THE DETERMINATION OF THICKNESS OF A SIC MATRIX (10-200-MU-M) SURROUNDING A WOVEN CARBON STRUCTURE
Authors: ZHU P BABOT D BERODIAS G PEIX G ABBE S
Citation: P. Zhu et al., X-RAY COHERENT SCATTER IN THE DETERMINATION OF THICKNESS OF A SIC MATRIX (10-200-MU-M) SURROUNDING A WOVEN CARBON STRUCTURE, Applied radiation and isotopes, 45(9), 1994, pp. 909-918
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