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Results:
1-7
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Results: 7
Authors:
BORGARINO M
MENOZZI R
BAEYENS Y
COVA P
FANTINI F
Citation: M. Borgarino et al., HOT-ELECTRON DEGRADATION OF THE DC AND RF CHARACTERISTICS OF ALGAAS INGAAS/GAAS PHEMTS/, I.E.E.E. transactions on electron devices, 45(2), 1998, pp. 366-372
Authors:
MENOZZI R
BORGARINO M
BAEYENS Y
VANHOVE M
FANTINI F
Citation: R. Menozzi et al., ON THE EFFECTS OF HOT-ELECTRONS ON THE DC AND RF CHARACTERISTICS OF LATTICE-MATCHED INALAS INGAAS/INP HEMTS/, IEEE microwave and guided wave letters, 7(1), 1997, pp. 3-5
Authors:
VANHOVE M
FINDERS J
VANDERZANDEN K
DERAEDT W
VANROSSUM M
BAEYENS Y
SCHREURS D
MENOZZI R
Citation: M. Vanhove et al., MATERIAL AND PROCESS-RELATED LIMITATIONS OF INP HEMT PERFORMANCE, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 311-315
Authors:
SCHREURS DMMP
BAEYENS Y
NAUWELAERS BKJC
DERAEDT W
VANHOVE M
VANROSSUM M
Citation: Dmmp. Schreurs et al., S-PARAMETER MEASUREMENT BASED QUASI-STATIC LARGE-SIGNAL COLD HEMT MODEL FOR RESISTIVE MIXER DESIGN, International journal of microwave and millimeter-wave computer-aided engineering, 6(4), 1996, pp. 250-258
Authors:
ROUQUETTE P
GASQUET D
BARBEROUSSE F
DERAEDT W
BAEYENS Y
Citation: P. Rouquette et al., INFLUENCE OF KINK EFFECT ON NOISE MEASUREMENTS IN INP SUBSTRATE PHEMTS AT MICROWAVE-FREQUENCIES, Solid-state electronics, 39(10), 1996, pp. 1423-1426
Authors:
MENOZZI R
BORGARINO M
COVA P
BAEYENS Y
FANTINI F
Citation: R. Menozzi et al., THE EFFECT OF HOT-ELECTRON STRESS ON THE DC AND MICROWAVE CHARACTERISTICS OF ALGAAS INGAAS/GAAS PHEMTS/, Microelectronics and reliability, 36(11-12), 1996, pp. 1899-1902
Authors:
SCHREURS D
SPIERS A
DERAEDT W
VANDERZANDEN K
BAEYENS Y
VANHOVE M
NAUWELAERS B
VANROSSUM M
Citation: D. Schreurs et al., DC, LF DISPERSION AND HF CHARACTERIZATION OF SHORT-TIME STRESSED INP BASED LM-HEMTS, Microelectronics and reliability, 36(11-12), 1996, pp. 1911-1914
Risultati:
1-7
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