Citation: C. Bainier et al., EVANESCENT INTERFEROMETRY BY SCANNING OPTICAL TUNNELING DETECTION, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(2), 1996, pp. 267-275
Citation: F. Baida et al., HIGH-RESOLUTION INTERFEROMETRY IN NEAR-FI ELD OPTICAL MICROSCOPY, Microscopy microanalysis microstructures, 5(4-6), 1994, pp. 409-425
Citation: D. Courjon et al., SEEING INSIDE A FABRY-PEROT RESONATOR BY MEANS OF A SCANNING TUNNELING OPTICAL MICROSCOPE, Optics communications, 110(1-2), 1994, pp. 7-12